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Personnel Selection in Forensic Science

9/7/2016-

by SIOP Administrative Office

SIOP Members Participate in Workshop Aimed at Using Measurement to Hire Pattern Evidence Examiners

Several SIOP members recently participated in a workshop to better understand how the pattern evidence domain in the field of forensic science can advance personnel selection and competency testing based on the research and practice activities of industrial and organizational (I-O) psychologists.

The two-day workshop, sponsored by the National Institute of Standards and Technology, brought together I-O psychologists who are experts on personnel selection and testing, forensic scientists, legal experts, as well as other researchers whose work has a nexus with needs in the forensic science field.

Attendees heard about the current status of selection and training of forensic scientists who specialize in pattern evidence, tools used in industrial and organizational psychology to understand elements of a task, and ways aptitude and performance can be measured.

An archived webcast of the workshop is now available on the Board on Human-Systems Integration’s Division of Behavioral and Social Sciences and Education website here.

The workshop objectives were (a) To bring together industrial-organizational psychologists, experts on personnel selection and testing, forensic scientists, as well as other researchers whose work has a nexus with workforce needs in the forensic science field with a focus on pattern evidence; (b) to develop a better understanding of the current status of selection and training of forensic scientists who specialize in pattern evidence, tools used in industrial and organizational psychology to understand elements of a task, and ways aptitude and performance can be measured; and (c) to discuss how these approaches could address challenges in the pattern evidence domain of the forensic sciences.

A summary of the presentations and discussions at the workshop will also be published in fall 2017 and available through The National Academies Press.

Several SIOP members were involved with this initiative. Committee members for the workshop included Chair Fred L. Oswald, Winfred Arthur, Jr., D. Zachary Hambrick, Andrew S. Imada, Randall S. Murch, Ann Marie Ryan, Jay A. Siegel, and Nancy T. Tippins.

Presenters included Mark W. Becker, Wendy S. Becker, John M. Collins, Jr., Melissa R. Gische, Rockne P. Harmon, Scott Highhouse, Bethany Jurs, Jessica LeCroy, SIOP President S. Mort McPhail (representing SIOP), Mara Merlino, Liberty Munson, Daniel Murrie, Dan Putka, Maria C. Ruggiero, Lisa Scott, Marvin E. Schechter, and Melissa Taylor.

For more information, email bohsi@nas.edu or visit http://www.nationalacademies.org/bohsi.

A summary of the presentations and discussions at the workshop will also be published in fall 2017 and available through The National Academies Press.

Several SIOP members were involved with this initiative. Committee members for the workshop included Fred L. Oswald, Chair, Winfred Arthur, Jr., D. Zachary Hambrick, Andrew S. Imada, Randall S. Murch, Ann Marie Ryan, Jay A. Siegel, and Nancy T. Tippins.

Presenters included Mark W. Becker, Wendy S. Becker, John M. Collins, Jr., Melissa R. Gische, Rockne P. Harmon, Scott Highhouse, Bethany Jurs, Jessica LeCroy, SIOP President S. Mort McPhail (representing SIOP), Mara Merlino, Liberty Munson, Daniel Murrie, Dan Putka, Maria C. Ruggiero, Lisa Scott, Marvin E. Schechter, and Melissa Taylor.

For more information, email bohsi@nas.edu or visit http://www.nationalacademies.org/bohsi.